Reduction of the dislocation density in HVPE-grown GaN epi-layers by an in situ SiNx treatment

Thumbnail Image

Files

Access status: Embargo until 2233-03-22 , Primary 84130.pdf (479.53 KB)

Date

2010

Authors

Ashraf, H.
Sridhara Rao, D.V.
Gogova, D.
Siche, D.
Fornari, R.
Humphreys, C.J.
Hageman, P.R. Paul

Journal Title

Journal ISSN

Volume Title

Publisher

Research Projects

Organizational Units

Journal Issue

Abstract

Description

Keywords

Citation

URI

https://hdl.handle.net/2066/84130

Collections

Academic research output

Endorsement

Review

Supplemented By

Referenced By