Spectroscopic ellipsometry on GaN: Comparison between hetero-epitaxial layers and bulk crystals

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1998

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Zauner, A.R.A.
Devillers, M.A.C.
Hageman, P.R. Paul
Larsen, P.K.
Porowski, S.

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Research Projects

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https://hdl.handle.net/2066/112574

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