Influence of surface relaxations on scanning probe microscopy images of the charge density wave material 2H-NbSe2

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Sivakumar, N.S.
Aretz, J.P.C. Joost
Scherb, S.
Midden Mavrič, M. van
Huijgen, N.
Kamber, U.
Wegner, D. Daniel
Khajetoorians, A.A.
Rösner, M.K. Malte
Hauptmann, N.

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