Complementary study of defects in GaN by photo-etching and TEM

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2002

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Weyher, J.L. Jan
Macht, L.
Tichelaar, F.D.
Zandbergen, H.W.
Hageman, P.R. Paul
Larsen, P.K.

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Research Projects

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https://hdl.handle.net/2066/112547

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