Quantitative analysis of variant III CuAu-I-type ordering of AlxGa1-xAs on (110), (111)A and (001) GaAs substrates using X-ray diffraction
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Niftrik, A.T.J. Ton
Bauhuis, G.J. Gerard
Schermer, J.J. John
Kim, H.
Voncken, M.M.A.J.
Mulder, P.
Larsen, P.K.